Name:
TIA ANSI/TIA/EIA-455-8 PDF
Published Date:
04/25/2000
Status:
[ Revised ]
Publisher:
Telecommunications Industry Association
Intent
This procedure describes the use of an optical time-domain reflectometer (OTDR) to indirectly measure the loss and reflectance of a splice or connector.
| ANSI : | ANSI Approved |
| Edition : | 00 |
| File Size : | 1 file , 74 KB |
| Number of Pages : | 24 |
| Published : | 04/25/2000 |