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Published Date: 01/01/1987

Semiconductor devices, Part 2.3: Integrated circuits - Analogue

Published Date: 01/01/1983

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - General principles of measuring methods

Published Date: 12/31/1981

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2J: General principles of measuring methods - analogue integrated circuits

Published Date: 01/01/1970

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2: General principles of measuring methods

Published Date: 01/01/1970

Letter symbols for semiconductor devices and integrated microcircuits

Published Date: 04/14/2015

Methods for sampling and testing aggregates, Method 2: Basic testing equipment

Published Date: 12/10/2014

Refractories and refractory materials - Physical test methods, Method 5: Determination of bulk density, apparent porosity and true porosity (ISO 5017:2013, MOD)

Published Date: 08/28/2019

IT Security techniques - Hash-functions, Part 3: Dedicated hash-functions

Published Date: 12/03/2014

Medical device traceability enabled by unique device identification (UDI)

Published Date: 05/12/2010

Energy management and energy efficiency — Glossary of terms

Published Date: 09/18/2013

Energy Efficiency Obligation Schemes in Europe — Overview and analysis of main features and possibilities for harmonisation

Published Date: 04/24/2015

Selection, use, care and maintenance of personal protective equipment for preventing electrostatic risks in hazardous areas (explosion risks)

Published Date: 11/24/2021

Space product assurance — Materials, mechanical parts and processes obsolescence management handbook

Published Date: 11/24/2021

Space product assurance — Reuse of existing software