Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2: General principles of measuring methods
This part of AS C366 gives information based on current practice on measurements of certain device parameters. It should not be regarded as a recommendation in the sense of a standaard because a more detailed description of the measuring methods is needed if results of measurement made on the basis of these principles have to be comparable within definite tolerances. It deals primarily iwith the parameters listed in Part 1, and it is intended that it will eventually be extended to cover all such parameters. Where seversl methods of measuring one parameter are described, it is implied that each method is suitable, although some methods are more accurate than others and some are more suited to production testing.
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2: General principles of measuring methods
