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AS C366.4-1978 PDF

AS C366.4-1978 PDF

Name:
AS C366.4-1978 PDF

Published Date:
12/31/1977

Status:
[ Superseded ]

Description:

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability

Publisher:
Standards Australia

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.246
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This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.
Edition : 1st
File Size : 1 file , 950 KB
Note : This product is unavailable in Russia, Belarus
Number of Pages : 13
Product Code(s) : 10171528
Published : 12/31/1977

History

AS 2547.2.4-1988
AS 2547.2.4-1988
Published Date: 01/01/1988
Semiconductor devices, Part 2.4: Integrated circuits - Interface
$29.304
AS 2547.2-1983
AS 2547.2-1983
Published Date: 01/01/1983
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - General principles of measuring methods
AS C366.4-1978
AS C366.4-1978
Published Date: 12/31/1977
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability
$15.246
AS C366.2-1970
AS C366.2-1970
Published Date: 01/01/1970
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 2: General principles of measuring methods

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