AS C366.3-1972 PDF

Published Date: 01/01/1986

Semiconductor devices, Part 3.1: Mechanical and climatic test methods

Published Date: 01/01/1983

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Reference methods of measurement

Published Date: 01/01/1978

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 5: Mechanical and climatic test methods

Published Date: 01/01/1972

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 3: Reference methods of measurement

Published Date: 06/30/2006

Refractories and refractory materials - Chemical analysis, Part 4: Dolomites and magnesites

Published Date: 12/31/1986

Non-destructive testing - Eddy current testing of metal tubes

Published Date: 05/01/1990

Safe storage and handling information cards for hazardous materials - Sulfuric acid (up to 98% m/m)

Published Date: 12/01/2001

Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Basic principals

Published Date: 12/01/2003

Inspection of measuring and test equipment - Instructions for the inspection of measuring and test equipment for geometrical quantities - Uncertainty of measurement

Published Date: 11/01/2001

Inspection of measuring and test equipments - Test instructions for micro meters

Published Date: 07/01/2005

Draft Document - Inspection of measuring and test equipment - Test instruction for micro meters for screw thread measurement

Published Date: 04/01/2010

Inspection of measuring and test equipment - Test instruction for micrometers for screw thread measurement and other measurement purposes

Published Date: 08/01/2002

Inspection of measuring and test equipment - Test instructions for micro meters with dial indicator