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AS 2547.3.1-1986 PDF

AS 2547.3.1-1986 PDF

Name:
AS 2547.3.1-1986 PDF

Published Date:
01/01/1986

Status:
[ Withdrawn ]

Description:

Semiconductor devices, Part 3.1: Mechanical and climatic test methods

Publisher:
Standards Australia

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$17.226
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Edition : 1st
File Size : 1 file , 1.2 MB
Note : This product is unavailable in Russia, Belarus
Number of Pages : 25
Product Code(s) : 10169229
Published : 01/01/1986

History

AS 2547.3.1-1986
AS 2547.3.1-1986
Published Date: 01/01/1986
Semiconductor devices, Part 3.1: Mechanical and climatic test methods
$17.226
AS 2547.3-1983
AS 2547.3-1983
Published Date: 01/01/1983
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Reference methods of measurement
AS C366.5-1978
AS C366.5-1978
Published Date: 01/01/1978
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 5: Mechanical and climatic test methods
$12.078
AS C366.3-1972
AS C366.3-1972
Published Date: 01/01/1972
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 3: Reference methods of measurement

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