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ASTM E673-02 PDF

ASTM E673-02 PDF

Name:
ASTM E673-02 PDF

Published Date:
07/10/2002

Status:
Active

Description:

Standard Terminology Relating to Surface Analysis

Publisher:
ASTM International

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$18.6
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1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).


File Size : 1 file , 93 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 10
Published : 07/10/2002

History

ASTM E673-03
ASTM E673-03
Published Date: 12/01/2003
Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
$18
ASTM E673-02b
ASTM E673-02b
Published Date: 12/10/2002
Standard Terminology Relating to Surface Analysis
$18.6
ASTM E673-02a
ASTM E673-02a
Published Date: 12/10/2002
Standard Terminology Relating to Surface Analysis
$18
ASTM E673-02
ASTM E673-02
Published Date: 07/10/2002
Standard Terminology Relating to Surface Analysis
$18.6
ASTM E673-01
ASTM E673-01
Published Date: 11/10/2001
Standard Terminology Relating to Surface Analysis
$18
ASTM E673-98E1
ASTM E673-98E1
Published Date: 01/01/1998
Standard Terminology Relating to Surface Analysis
$17.4

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