Name:
ASTM E673-02b PDF
Published Date:
12/10/2002
Status:
Active
Publisher:
ASTM International
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
| File Size : | 1 file , 100 KB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 10 |
| Published : | 12/10/2002 |
