ASTM F1595-00(2005) PDF

ASTM F1595-00(2005) PDF

Name:
ASTM F1595-00(2005) PDF

Published Date:
05/01/2005

Status:
Active

Description:

Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$15
Need Help?

1.1 This practice covers procedures for performing visual inspection of membrane switches. This includes visual inspection of overlays and circuitry.

1.2 This practice defines lighting parameters, distance from eye to specimen, viewing angle, and the viewing time allowed for a specific size specimen.

1.3 This practice is only designed for visual inspection of aesthetic qualities of membrane switches. It is not intended for color matching or gloss measurement.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


File Size : 1 file , 49 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 2
Published : 05/01/2005
Redline File Size : 2 files , 98 KB

History

ASTM F1595-00(2020)
Published Date: 09/01/2020
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches (Withdrawn 2023)
$19.8
ASTM F1595-00(2012)
Published Date: 02/01/2012
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
$15.6
ASTM F1595-00(2005)
Published Date: 05/01/2005
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
$15
ASTM F1595-00
Published Date: 12/10/2000
Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
$15

Related products

ASTM F95-89(2000)
Published Date: 01/01/2000
Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
$17.4
ASTM F358-83(2002)
Published Date: 01/01/2002
Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
$15
ASTM F1153-92(2002)
Published Date: 01/01/2002
Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)
$17.4

Best-Selling Products

UNE-ISO/IEC 14143-2:2009
Published Date: 02/04/2009
Information technology. Software measurement. Functional size measurement. Part 2: Conformity evaluation of software size measurement methods to ISO/IEC 14143-1:1998.
UNE-ISO/IEC 14598-1:2004
Published Date: 12/17/2004
Information technology -- Software product evaluation -- Part 1: General overview
UNE-ISO/IEC 14598-2:2004
Published Date: 12/17/2004
Software engineering -- Product evaluation -- Part 2: Planning and management
UNE-ISO/IEC 14598-3:2005
Published Date: 07/27/2005
Software engineering -- Product evaluation -- Part 3: Process for developers
UNE-ISO/IEC 14598-6:2007
Published Date: 12/12/2007
Software engineering. Product evaluation. Part 6: Documentation of evaluation modules. (ISO/IEC 14598-6:2001)
UNE-ISO/IEC 15939:2009
Published Date: 12/02/2009
Systems and software engineering. Measurement process