Name:
ASTM F1893-11 PDF
Published Date:
01/01/2011
Status:
Active
Publisher:
ASTM International
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
| File Size : | 1 file , 92 KB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 7 |
| Published : | 01/01/2011 |
| Redline File Size : | 2 files , 180 KB |
