Name:
ASTM F1893-98 PDF
Published Date:
05/10/1998
Status:
Active
Publisher:
ASTM International
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
| File Size : | 1 file , 49 KB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 5 |
| Published : | 05/10/1998 |
