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ASTM F1893-98 PDF

ASTM F1893-98 PDF

Name:
ASTM F1893-98 PDF

Published Date:
05/10/1998

Status:
Active

Description:

Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

Publisher:
ASTM International

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$17.4
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1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.


File Size : 1 file , 49 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 5
Published : 05/10/1998

History

ASTM F1893-18
ASTM F1893-18
Published Date: 03/01/2018
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
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ASTM F1893-11
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Published Date: 01/01/2011
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
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ASTM F1893-98(2003)
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Published Date: 01/01/2003
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
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ASTM F1893-98
ASTM F1893-98
Published Date: 05/10/1998
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
$17.4

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