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ASTM F576-00 PDF

ASTM F576-00 PDF

Name:
ASTM F576-00 PDF

Published Date:
01/01/2000

Status:
Active

Description:

Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Publisher:
ASTM International

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$17.4
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Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
File Size : 1 file , 280 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 9
Published : 01/01/2000

History

ASTM F576-01
ASTM F576-01
Published Date: 06/10/2001
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry (Withdrawn 2003)
$17.4
ASTM F576-00
ASTM F576-00
Published Date: 01/01/2000
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
$17.4

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