Organic flat sheet and hollow fiber ultrafiltration membranes were characterized by optical
and microscopic methods. White Light Interferometry (WLI) and Atomic Force Microscopy
(AFM) show that the membrane roughness increases markedly with the observation scale and
that there is continuity between the different scan sizes and techniques for the determination
of the RMS roughnesses. The high angular resolution ellipsometric measurements allows for
obtaining the signature of each cut-off and the origin of the scattering was identified as coming
from membrane bulk. Includes 19 references, table, figures.
| Edition : | Vol. - No. |
| File Size : | 1
file
, 1.8 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 6 |
| Published : | 11/01/2009 |
