BS EN 60749-4:2002 PDF

Name:
BS EN 60749-4:2002 PDF

Published Date:
09/10/2002

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 60749-5

Partially replaces BS EN 60749:1999.

File Size :	1 file , 380 KB
ISBN(s) :	0580403351
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	12
Product Code(s) :	30064927, 30064927, 30064927
Published :	09/10/2002

Published Date: 11/28/2017

Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

$57.15

Published Date: 09/10/2002

Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

$48.006