BS EN 60749-4:2017 PDF

BS EN 60749-4:2017 PDF

Name:
BS EN 60749-4:2017 PDF

Published Date:
11/28/2017

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
British-Adopted European Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$57.15
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BS EN 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.


Cross References:
EN 60749-5
IEC 60749-5


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1.1 MB
ISBN(s) : 9780580942297
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 14
Product Code(s) : 30341342, 30341342, 30341342
Published : 11/28/2017

History

BS EN 60749-4:2017
Published Date: 11/28/2017
Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)
$57.15
BS EN 60749-4:2002
Published Date: 09/10/2002
Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)
$48.006

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