Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
British-Adopted European Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

BS EN 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Cross References:
EN 60749-5
IEC 60749-5

All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 1.1 MB
ISBN(s) :	9780580942297
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	14
Product Code(s) :	30341342, 30341342, 30341342
Published :	11/28/2017

BS EN 60749-4:2017 PDF

Semiconductor devices. Mechanical and climatic test methods-Damp heat, steady state, highly accelerated stress test (HAST)

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