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BS EN 60749-27:2006+A1:2012 PDF

BS EN 60749-27:2006+A1:2012 PDF

Name:
BS EN 60749-27:2006+A1:2012 PDF

Published Date:
01/31/2013

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

Publisher:
British-Adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57.15
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Cross References:
IEC 61340-3-2
IEC 60749-26
EN 61340-3-2:2002
EN 60749-26:2006


Partially replaces BS EN 60749:1999.

Incorporates the following:
Amendment, January 2013. Amends and replaces BS EN 60749-27:2006
File Size : 1 file , 620 KB
ISBN(s) : 9780580766084
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 16
Product Code(s) : 30252691, 30252691, 30252691
Published : 01/31/2013

History

BS EN 60749-27:2006+A1:2012
BS EN 60749-27:2006+A1:2012
Published Date: 01/31/2013
Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
$57.15
BS EN 60749:1999
BS EN 60749:1999
Published Date: 09/23/2002
Semiconductor devices. Mechanical and climatic test methods
$119.634
BS 6493-3:1985
BS 6493-3:1985
Published Date: 01/31/1986
Semiconductor devices-Mechanical and climatic test methods
$92.964

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