BS EN 60749-1:2003 PDF

BS EN 60749-1:2003 PDF

Name:
BS EN 60749-1:2003 PDF

Published Date:
07/07/2003

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-General

Publisher:
British-Adopted European Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$48.006
Need Help?


Cross References:
IEC 60050
IEC 60747
IEC 60748
EN 60747

File Size : 1 file , 320 KB
ISBN(s) : 0580421988
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 12
Product Code(s) : 30047762, 30047762, 30047762
Published : 07/07/2003

History

BS EN 60749-1:2003
Published Date: 07/07/2003
Semiconductor devices. Mechanical and climatic test methods-General
$48.006
BS EN 60749:1999
Published Date: 09/23/2002
Semiconductor devices. Mechanical and climatic test methods
$119.634
BS 6493-3:1985
Published Date: 01/31/1986
Semiconductor devices-Mechanical and climatic test methods
$92.964

Related products

BS EN 60749-27:2006+A1:2012
Published Date: 01/31/2013
Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
$57.15
BS EN 60191-6-20:2010
Published Date: 12/31/2010
Mechanical standardization of semiconductor devices-General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Measuring methods for package dimensions of small outline J-lead packages (SOJ)
$57.15

Best-Selling Products

LAN Technologies Explained
Published Date: 04/01/2000