Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Publisher:
British-Adopted European Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 60749-4
IEC 60749-5
IEC 60749-11
IEC 60749-20:2002
IEC 60749-24
IEC 60749-25:2003
IEC 60749-33
EN 60749-4: 2002
EN 60749-5:2003
EN 60749-11:2002
EN 60749-20:2003
EN 60749-24:2004
EN 60749-25:2003
EN 60749-33:2004

File Size :	1 file , 750 KB
ISBN(s) :	0580477525
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	16
Product Code(s) :	30105347, 30105347, 30105347
Published :	01/27/2006

BS EN 60749-30:2005 PDF

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

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