BS EN IEC 60749-30:2020 PDF

BS EN IEC 60749-30:2020 PDF

Name:
BS EN IEC 60749-30:2020 PDF

Published Date:
09/30/2020

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing

Publisher:
British-Adopted European Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$57.15
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This part of IEC 60749 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.

The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.

These SMDs are subjected to the appropriate preconditioning sequence described in this document prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress).

All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1 MB
ISBN(s) : 9780539045833
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 18
Product Code(s) : 30394482, 30394482, 30394482
Published : 09/30/2020

History

BS EN IEC 60749-30:2020
Published Date: 09/30/2020
Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing
$57.15
BS EN 60749-30:2005+A1:2011
Published Date: 09/30/2011
Semiconductor devices. Mechanical and climatic test methods-Preconditioning of non-hermetic surface mount devices prior to reliability testing
$57.15
BS EN 60749-30:2005
Published Date: 01/27/2006
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing
$28.194

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