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BS EN 62374:2007 PDF

BS EN 62374:2007 PDF

Name:
BS EN 62374:2007 PDF

Published Date:
10/31/2008

Status:
Active

Description:

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Publisher:
British-Adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
bs-en-62374-2007_1590000
Choose Document Language:
$79.25
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All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 740 KB
ISBN(s) : 9780580540486
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 24
Product Code(s) : 30100338, 30100338, 30100338
Published : 10/31/2008

History

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