The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).
Cross References:ASTM E 265
ASTM E 264
ASTM E 263
ASTM E 721
MIL-STD-883
ASTM E 1018
ASTM E 722
ASTM E 720
ASTM E 668
ASTM E 2450
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 870 KB |
| ISBN(s) : | 9780539000627 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 12 |
| Product Code(s) : | 30373810, 30373810, 30373810 |
| Published : | 05/15/2019 |
