Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance diodes for tuning applications
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Loco-type multitubular boilers of riveted construction
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (c.w. operation)
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (pulse operation)
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave passive limiter diodes
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation)
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation)
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low current rectifier diodes (up to 3 ampere rating)
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current rectifier diodes (greater than 50 ampere rating)
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