High density recording format on CD-R/RW disc system. HD-BURN format
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Semiconductor devices. Hot carrier test on MOS transistors
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Semiconductor devices. Metallization stress void test
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Control technology. Rules for the designation of measuring instruments
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Concentric lay stranded overhead electrical conductors containing one or more gap(s)
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Electronics assembly technology. Electronic modules
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Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
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Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
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Representation of process control engineering. Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
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EMC IC modelling-Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
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