Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz-Fields produced by devices used for electronic article surveillance, radio frequency identification and similar systems
Document status: Active
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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Semiconductor devices-Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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Video systems (625/50 progressive). Video and accompanied data using the vertical blanking interval. Analogue interface
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Maritime navigation and radiocommunication equipment and systems. Electronic chart system (ECS). Operational and performance requirements, methods of testing and required test results
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Common control interface for networked digital audio and video products-Audio
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Automation systems in the process industry. Factory acceptance test (FAT), site acceptance test (SAT) and site integration test (SIT)
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Control systems in the process industry. Electrical and instrumentation loop check
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DC or AC supplied electronic control gear for LED modules. Performance requirements
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