Publisher : IEC

BS IEC 62047-31:2019 PDF

Semiconductor devices. Micro-electromechanical devices-Four-point bending test method for interfacial adhesion energy of layered MEMS materials

Document status: Active

$190.50
BS IEC 62047-32:2019 PDF

Semiconductor devices. Micro-electromechanical devices-Test method for the nonlinear vibration of MEMS resonators

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$190.50
BS IEC 62047-38:2021 PDF

Semiconductor devices. Micro-electromechanical devices-Test method for adhesion strength of metal powder paste in MEMS interconnection

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$190.50
BS IEC 62047-41:2021 PDF

Semiconductor devices. Micro-electromechanical devices-RF MEMS circulators and isolators

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$309.88
BS IEC 62047-42:2022 PDF

Semiconductor devices. Micro-electromechanical devices-Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

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$264.16
BS IEC 62047-43:2024 PDF

Semiconductor devices. Micro-electromechanical devices-Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

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$190.50
BS IEC 62047-44:2024 PDF

Semiconductor devices. Micro-electromechanical devices-Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

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$190.50
BS IEC 62047-48:2024 PDF

Semiconductor devices. Micro-electromechanical devices-Test method for determining solution concentration by optical absorption using MEMS fluidic device

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$190.50
BS IEC 62050:2005 PDF

VHDL register transfer level (RTL) synthesis

Document status: Active

$398.78
BS IEC 62055-41:2014 PDF

Electricity metering. Payment systems-Standard transfer specification (STS). Application layer protocol for one-way token carrier systems

Document status: Active

$398.78