Name:
CEI EN 60749-5 PDF
Published Date:
11/01/2017
Status:
[ Revised ]
Publisher:
Comitato Elettrotecnico Italiano
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.
| Edition : | 17 |
| File Size : | 1 file , 1.5 MB |
| Number of Pages : | 18 |
| Published : | 11/01/2017 |