CEI EN 60749-5 PDF

CEI EN 60749-5 PDF

Name:
CEI EN 60749-5 PDF

Published Date:
11/01/2017

Status:
[ Revised ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
cei-en-60749-5_2752262

Choose Document Language:
11.70 €
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This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This test method is considered destructive.


Edition : 17
File Size : 1 file , 1.5 MB
Number of Pages : 18
Published : 11/01/2017

History

CEI EN IEC 60749-5
Published Date: 04/01/2024
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
10.20 €
CEI EN 60749-5
Published Date: 11/01/2017
Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
11.70 €
CEI EN 60749-5
Published Date: 10/01/2005
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
7.50 €

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