CEI EN IEC 60749-5 PDF

Name:
CEI EN IEC 60749-5 PDF

Published Date:
04/01/2024

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

ENGLISH

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

Edition :	24#
File Size :	1 file , 1.5 MB
Number of Pages :	18
Published :	04/01/2024

History

CEI EN IEC 60749-5

Published Date: 04/01/2024

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

$10.2

CEI EN 60749-5

Published Date: 11/01/2017

Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test

$11.7

CEI EN 60749-5

Published Date: 10/01/2005

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

$7.5

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