CEI EN 62374 PDF

Name:
CEI EN 62374 PDF

Published Date:
03/01/2009

Status:
[ Active ]

Description:

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Norma recepita mediante l'annuncio su CEI MAGAZINE marzo 2009.La presente Norma recepisce il testo originale inglese della Pubblicazione IEC e pertanto consta delle sole pagine dispari.

Edition :	09
File Size :	1 file , 290 KB
Number of Pages :	28
Published :	03/01/2009

History

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