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CEI EN 62374 PDF

CEI EN 62374 PDF

Name:
CEI EN 62374 PDF

Published Date:
03/01/2009

Status:
[ Active ]

Description:

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$22.2
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Norma recepita mediante l'annuncio su CEI MAGAZINE marzo 2009.La presente Norma recepisce il testo originale inglese della Pubblicazione IEC e pertanto consta delle sole pagine dispari.


Edition : 09
File Size : 1 file , 290 KB
Number of Pages : 28
Published : 03/01/2009

History

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