Name:
DANSK DS/EN 60749-18 PDF
Published Date:
03/21/2003
Status:
[ Withdrawn ]
Publisher:
Dansk Standard
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
| Edition : | 03 |
| File Size : | 1 file , 200 KB |
| Number of Pages : | 22 |
| Product Code(s) : | DS-021, DS-021 |
| Published : | 03/21/2003 |