Name:
DANSK DS/EN 60749-3 PDF
Published Date:
09/23/2002
Status:
[ Withdrawn ]
Publisher:
Dansk Standard
The purpose of this part of IEC 60749 is to verify that the materials, design, construction,markings, and workmanship of a semiconductor device are in accordance with the applicable porcurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.
| Edition : | 02 |
| File Size : | 1 file , 140 KB |
| Number of Pages : | 10 |
| Product Code(s) : | DS-009, DS-009 |
| Published : | 09/23/2002 |
