Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

SAME AS IEC 61338-1-5

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.

Edition :	15
File Size :	1 file , 1.8 MB
Number of Pages :	34
Product Code(s) :	DS-031, DS-031
Published :	09/16/2015

DANSK DS/EN 61338-1-5 PDF

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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