Name:
DANSK DS/IEC 63275-2 PDF
Published Date:
05/17/2022
Status:
[ Active ]
Publisher:
Dansk Standard
IEC 63275-2:2022 gives the test method and a procedure using this method to evaluate the on-state voltage change, on-state resistance change and reverse drain voltage change of silicon carbide (SiC) power MOSFET devices due to body diode operation. This test is not generally requested for Si power transistors.
| Edition : | 22 |
| File Size : | 1 file , 1.5 MB |
| Number of Pages : | 16 |
| Product Code(s) : | DS-013, DS-013 |
| Published : | 05/17/2022 |