DANSK DSF/FPREN 60749-4 PDF

Name:
DANSK DSF/FPREN 60749-4 PDF

Published Date:

Status:
[ Draft ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

DRAFT

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Edition :	16
File Size :	1 file , 510 KB
Number of Pages :	11
Product Code(s) :	DSF-009, DSF-009

History

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