DIN 41650-1 PDF

Published Date: 07/01/2006

Fixed capacitors for use in electronic equipment - Part 17-1: Blank detail specification - Fixed metallized polypropylene film dielectric a.c. and pulse capacitors - Assessment levels E and EZ (IEC 60384-17-1:2005); German version EN 60384-17-1:2005

Published Date: 11/01/2006

Connectors for electronic equipment - Tests and measurements - Part 13-5: Mechanical operation tests - Test 13e: Polarizing and keying method (IEC 60512-13-5:2006); German version EN 60512-13-5:2006

Published Date: 12/01/2023

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022

Published Date: 10/01/2011

Lasers and laser-related equipment - Test methods for laser-induced damage threshold - Part 2: Threshold determination (ISO 21254-2:2011)

Published Date: 04/01/2023

COMPLETE HARDCOPY SET OF AEROSPACE INDUSTRIES ASSOCIATION (AIA) NATIONAL AEROSPACE STANDARDS - INCLUDES ALL CURRENT & INACTIVE FORNEW DESIGN NAS, NASM, NA & METRIC NAS STANDARDS* * 12 VOLUME SET ADD ON 12" GLOBAL BINDER 3" WHITE & (1) GLOBAL BINDER 1" WHITE

Published Date: 07/01/1960

[BEST AVAILABLE COPY] Electrical Test Procedures for Radomes and Radome Materials

Published Date: 03/31/2011

RIVET, SOLID, UNIVERSAL HEAD, ALUMINUM AND ALUMINUM ALLOY, METRIC

Published Date: 01/01/1978

Rivet, Solid - Universal Head Aluminum and Aluminum Alloy, Metric

Published Date: 12/19/2014

RIVET, SOLID, UNIVERSAL HEAD, ALUMINUM AND ALUMINUM ALLOY, METRIC

Published Date: 12/19/2014

RIVET, SOLID, UNIVERSAL HEAD, ALUMINUM AND ALUMINUM ALLOY, METRIC