DIN EN IEC 60749-37 PDF

Name:
DIN EN IEC 60749-37 PDF

Published Date:
12/01/2023

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022

Publisher:
DIN EN IEC

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file
Number of Pages :	23
Product Code(s) :	3447309, 3447309, 3447309
Published :	12/01/2023

History

DIN EN IEC 60749-37

Published Date: 12/01/2023

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022

$33.681

DIN EN IEC 60749-37 - DRAFT

Published Date: 02/01/2023

Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020

$35.316

DIN EN 60749-37

Published Date: 08/01/2008

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2008); German version EN 60749-37:2008

$33.681

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