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DIN EN IEC 60749-37 PDF

DIN EN IEC 60749-37 PDF

Name:
DIN EN IEC 60749-37 PDF

Published Date:
12/01/2023

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022

Publisher:
DIN EN IEC

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$33.681
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File Size : 1 file
Number of Pages : 23
Product Code(s) : 3447309, 3447309, 3447309
Published : 12/01/2023

History

DIN EN IEC 60749-37
DIN EN IEC 60749-37
Published Date: 12/01/2023
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022
$33.681
DIN EN IEC 60749-37 - DRAFT
DIN EN IEC 60749-37 - DRAFT
Published Date: 02/01/2023
Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020
$35.316
DIN EN 60749-37
DIN EN 60749-37
Published Date: 08/01/2008
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2008); German version EN 60749-37:2008
$33.681

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