DIN 50439 PDF

Published Date: 04/01/1982

Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering

Published Date: 08/01/1987

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell

Published Date: 08/01/2023

Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method

Published Date: 06/01/1991

Testing of materials for semiconductor technology; methods for characterizing photoresists; determination of coating thickness with optical methods

Published Date: 07/13/2023

Additive manufacturing of metals - Non-destructive testing and evaluation - Defect detection in parts (ISO/ASTM TR 52905:2023)

Published Date: 07/01/2022

Additive manufacturing - Non-destructive testing - Intentionally seeding flaws in metallic parts (ISO/ASTM/TR 52906:2022)

Published Date: 10/21/2020

Additive manufacturing - Design - Functionally graded additive manufacturing (ISO/ASTM/TR 52912:2020)

Published Date: 03/01/2022

Additive manufacturing for medical - Data - Optimized medical image data (ISO/ASTM TR 52916:2022)

Published Date: 11/28/2022

Additive manufacturing - Round robin testing - General guidelines (ISO/ASTM TR 52917:2022)

Published Date: 07/25/2023

Additive Manufacturing of metals - Feedstock materials - Correlating of rotating drum measurement with powder spreadability in PBF-LB machines (ISO/ASTM TR 52952:2023)