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DIN 50453-1 PDF

DIN 50453-1 PDF

Name:
DIN 50453-1 PDF

Published Date:
08/01/2023

Status:
Active

Description:

Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method

Publisher:
Deutsches Institut Fur Normung E.V. (German National Standard)

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.696
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File Size : 1 file
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 9
Product Code(s) : 3434027, 3434027, 3434027
Published : 08/01/2023

History

DIN 50453-1
DIN 50453-1
Published Date: 08/01/2023
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method
$15.696
DIN 50453-1 - DRAFT
DIN 50453-1 - DRAFT
Published Date: 02/01/2023
Draft Document - Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method
$15.696
DIN 50453-1
DIN 50453-1
Published Date: 10/01/1990
Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium monocrystals; gravimetric method
$13.734

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Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
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DIN 50456-3
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Published Date: 08/01/1999
Characterization of encapsulating compounds for electronic components used in semiconductor technology - Part 3: Determination of cationic impurities
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DIN 50451-1
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Published Date: 04/01/2003
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
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DIN 50451-3
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Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
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