DIN EN 60749-12 - DRAFT PDF

DIN EN 60749-12 - DRAFT PDF

Name:
DIN EN 60749-12 - DRAFT PDF

Published Date:
08/01/2017

Status:
[ Withdrawn ]

Description:

Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 47/2386/CDV:2017); German version prEN 60749-12:2017

Publisher:
DIN-adopted European Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$15.696
Need Help?

File Size : 1 file
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 12
Product Code(s) : 2688579, 2688579
Published : 08/01/2017

History

DIN EN IEC 60749-12
Published Date: 07/01/2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018
$17.985
DIN EN 60749-12 - DRAFT
Published Date: 08/01/2017
Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 47/2386/CDV:2017); German version prEN 60749-12:2017
$15.696
DIN EN 60749-12
Published Date: 04/01/2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002
$13.407

Related products

DIN EN IEC 60749-18
Published Date: 02/01/2020
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019
$32.7
DIN EN 60749-29
Published Date: 01/01/2012
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
$35.316
DIN IEC 60749-37 - DRAFT
Published Date: 12/01/2005
Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method of components for handheld electronic products (IEC 47/1824/CD:2005)
$31.392
DIN EN 62374-1
Published Date: 06/01/2011
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010); German version EN 62374-1:2010 + AC:2011
$31.392

Best-Selling Products

NATO AACP-02.1
Published Date: 07/09/2019
COUNTRY POINTS OF CONTACT
NATO AACP-02
Published Date: 07/09/2019
GUIDELINES FOR MUTUAL PROVISION OF CONTRACT AUDITS
NATO AACP-1
Published Date: 01/01/1989
GUIDANCE FOR THE DRAFTING OF MOUS AND PROGRAMME MOUS - BASIC CONSIDERATIONS CHECKLIST
NATO AACP-2 VOL 10
Published Date: 02/14/2012
GUIDELINES FOR MUTUAL PROVISION OF CONTRACT AUDITS - VOLUME 10
NATO AACP-2 VOL 1
Published Date: 09/01/1994
GUIDELINES ON CONTRACTUAL TERMS FOR FEASIBILITY STUDY WORK - VOLUME 1
NATO AACP-2 VOL 2
Published Date: 09/01/1994
GUIDELINES ON CONTRACTUAL TERMS FOR PROJECT DEFINITION AND DESIGN AND DEVELOPMENT - VOLUME 2