DIN EN 60749-28 - DRAFT PDF

Published Date: 02/01/2018

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017

Published Date: 07/01/2012

Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)

Published Date: 11/01/1971

Transmission systems and two-ports; measures for attenuation

Published Date: 05/01/1983

Harmonized system of quality assessment for electronic components; blank detail specification: aluminium electrolytic capacitors with solid electrolyte

Published Date: 07/01/2023

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (IEC 62007-1:2015 + AMD1:2022); German version EN 62007-1:2015 + A1:2022

Published Date: 08/01/2006

Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006)

Published Date: 01/01/1971

ISO system of limits and fits - Part 1: Inspection of plain workpieces

Published Date: 02/01/1971

ISO system of limits and fits - Part II : Inspection of plain workpieces

Published Date: 12/01/1965

Dial gauges reading in 0.01 mm, 0.001 in and 0.0001 in

Published Date: 01/01/1967

Conventional signs to be used in the schemes for the installations of pipeline systems in ships

Published Date: 12/01/1967

Conventional signs to be used in schemes for the installations of ventilation systems in ships

Published Date: 01/01/1969

Rectangular or Square Parallel Keys and their Corresponding Keyways (Dimensions in Millimetres)