DIN EN 62276 PDF

Published Date: 08/01/2017

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016

Published Date: 08/01/2013

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013

Published Date: 10/01/2009

Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/879/CD:2009)

Published Date: 04/01/2006

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005

Published Date: 04/01/1996

Sectional specification: Variable capacitors (Qualification approval); German version EN 134100:1995

Published Date: 01/01/2005

Draft Document - Fixed resistors for use in electronic equipment - Part 8-1 Blank detail specification: Fixed surface mount (SMD) resistors - Assessment level EZ (IEC 40/1458/CD:2004)

Published Date: 05/01/2022

Integrated optics - Vocabulary - Part 2: Terms used in classification (ISO 11807-2:2021)

Published Date: 02/01/1991