DIN EN 62276 PDF

Published Date: 08/01/2017

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016

Published Date: 08/01/2013

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013

Published Date: 10/01/2009

Draft Document - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/879/CD:2009)

Published Date: 04/01/2006

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005

Published Date: 07/01/2001

Piezoelectric filters of assessed quality - Part 4: Sectional specification; Capability approval (IEC 60368-4:2000); German version EN 60368-4:2000 + Corrigendum:2001

Published Date: 07/01/2005

Filters using waveguide type dielectric resonators - Part 1:Generic specification (IEC 61337-1:2004); German version EN 61337-1:2004

Published Date: 12/01/2011

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011

Published Date: 04/01/2012

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters (IEC/TS 61994-2:2011)

Published Date: 10/17/2002