ECIA EIA-364-102 PDF

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 02/01/2019

Waveguide Flanges – Dual Contact Pressurizeable and Miniature Type for Waveguide Sizes WR90 to WR975

Published Date: 02/01/1986

Taping of Surface Mount Components for Automatic Handling

Published Date: 04/01/2012

TP-02D Air Leakage Test Procedure for Electrical Connectors

Published Date: 08/01/1996

Generic Specification for Electronic and Electrical Connectors of Certified Quality (for Frequencies Essentially Below 3 MHz)

Published Date: 12/31/1988

IEEE Guide for the Statistical Analysis of Thermal Life Test Data

Published Date: 12/15/1980

IEEE Standard for Shunt Power Capacitors

Published Date: 04/06/1961

ANSI/IEEE Radio Interference: Methods of Measurement of Conducted Interference Output to the Power Line from FM and Television Broadcast Receivers in the Range of 300 kHz to 25 MHz

Published Date: 1968

USA Standard Test Code for Distribution, Power and Regulating Transformers, and Shunt Reactors

Published Date: 12/29/1975

IEEE Standard for Graphic Symbols for Electrical and Electronics Diagrams (Including Reference Designation Letters)

Published Date: 09/12/1986

American National Standard - Supplement to Graphic Symbols for Electrical and Electronics Diagrams