ECIA EIA-364-102 PDF

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 12/01/1998

TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

Published Date: 08/01/1994

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Published Date: 09/01/2022

Fixed Capacitors for Use in Electronic Equipment - Part 24: Sectional Specification - Fixed Tantalum Electrolytic Surface Mount Capacitors with Conductive Polymer Solid Electrolyte

Published Date: 05/28/1996

Detail Specification for Mechanically Actuated (Zero and Low Insertion Force) Sockets for Pin Grid Array Devices with 2.54 mm X 2.54 mm (0.1 in X 0.1 in) Spacing for Use in Electronic Equipment

Published Date: 04/01/2002

TP-30A Capacitance Test Procedure for Electrical Connectors and Sockets

Published Date: 02/01/1995

Published Date: 10/01/2001