Name:
ECIA EIA-448-1B PDF
Published Date:
03/01/1993
Status:
[ Active ]
Publisher:
Electronic Components Industry Association
PURPOSE
The purpose of this test method is to determine the duration of contact bounce so that it can be anticipated and provided for in user circuits. This phenomenon is defined as the random opening and closing of a switch contact that occurs after contact transfer caused by the switch mechanism. It is measured from the moment of first closure (or opening) to the moment when the contacts reach a useful state of equilibrium. Logic circuits are particularly sensitive to the kinetic behavior of switching contacts. Unless designed appropriately, these circuits can be triggered to produce spurious data as a result of contact bounce.
| ANSI : | ANSI Approved |
| Edition : | B |
| File Size : | 0 files |
| Number of Pages : | 7 |
| Published : | 03/01/1993 |
