The purpose of ESD TR5.5-05-20 is to address two key points:
- 1) Measurement issues: under what conditions it is possible to perform a valid measurement of transient response and know that the results are real characteristics of the device being tested and not set-up artifacts.
- 2) Report a collection of already available and published characterization examples, useful to assess better the relevance of this type of measurement and the expected impact on ESD performances (especially during CDM stress).
The starting point of this report is the TLP system and its related requirements, as described in ANSI/ESD STM5.5.1. The most important modifications needed to address the initial transient response will be presented here.
| File Size : | 1
file
, 2.4 MB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 49 |
| Published : | 2020 |
