IEC 60747-8-1 Ed. 1.0 b:1987 PDF

Published Date: 06/16/2000

Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

Published Date: 03/31/1989

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification

Published Date: 04/20/1995

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications

Published Date: 07/18/2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Published Date: 08/01/2000