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IEC 62373 Ed. 1.0 b:2006 PDF

IEC 62373 Ed. 1.0 b:2006 PDF

Name:
IEC 62373 Ed. 1.0 b:2006 PDF

Published Date:
07/18/2006

Status:
Active

Description:

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$28.5
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Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Edition : 1.0
File Size : 1 file , 530 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 27
Published : 07/18/2006

History

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