IEC 60749-1 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-1 Ed. 1.0 b:2002 PDF

Published Date:
08/30/2002

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

Edition :	1.0
File Size :	1 file , 390 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	15
Published :	08/30/2002

History

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