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IEC 60749-10 Ed. 1.0 b:2002 PDF

IEC 60749-10 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-10 Ed. 1.0 b:2002 PDF

Published Date:
04/09/2002

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$3.9
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Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.
Edition : 1.0
File Size : 1 file , 400 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 7
Published : 04/09/2002

History

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IEC 60749-10 Ed. 1.0 b:2002
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