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IEC 60749-11 Ed. 1.0 b:2002 PDF

IEC 60749-11 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-11 Ed. 1.0 b:2002 PDF

Published Date:
04/12/2002

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$7.5
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Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
Edition : 1.0
File Size : 1 file , 410 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 13
Published : 04/12/2002

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